Equipment Methods Electron Microscopy Laboratory - Department of Physics AUTh High Resolution Transmission Electron Microscope JEOL 2011  (200KV), with a point resolution of 0.194 nm. The microscope is equipped with: KeenView G2 TEM CCD camera system (Olympus Soft Imaging  Solutions) SPININGSTAR P020 device, for the precession and tilting of the  electron beam (Nanomegas) accompanied with the necessary software High Resolution Transmission Electron Microscope JEOL  2000FX (200KV), with a point resolution of 0.28 nm Conventional Transmission Electron Microscope JEOL 100CX (100KV) with a resolution 0.5nm, with heating, cooling and tensile stress facilities Atomic Force Microscope (AFM) Explorer 2000 Truemetrix Topometrix, with two scanners of (100X100) μm, (2.5X2.5) μm, and a liquid scanner of (2.5X2.5) μm. Resolution in the nanometre scale. Working at Contact mode, Tapping mode, Lateral Force mode Experimental Methods Applications STRUCTURE Transmission Electron Microscopy (TEM) Scanning Microscopy (SEM) Atomic Force Microscopy (AFM) X-ray Diffraction (XRD) GROWTH e-beam evaporation 3 materials PHYSICAL PROPERTIES Magnetic (VSM) Magnetotransport (GMR, Hall) Magneto-Optic (MOKE) Modern Magnetic Media Biomedical Applications Sensors & Actuators